Browse by Author Wong, AKK

TitleAuthor(s)YearView Count
Computation lithography: Virtual reality and virtual virtualityLam, EY; Wong, AKK2009280
The nebulous hotspot and algorithm variabilityWong, AKK; Lam, EY2009111
Computation lithography: Virtual reality and virtual virtualityWong, AKK; Lam, EY200960
Designing of precomputational-based low-power Viterbi decoderYang, JL; Wong, AKK2004639
Standard cell design with regularly placed contacts and gatesWang, J; Wong, AKK; Lam, EYM200479
Modeling the effects of patterning error on MOSFETPun, CH; Lai, PT; Wong, AKK200461
Effects of grid-placed contacts on circuit performanceWang, J; Wong, AKK2003626
Placement sensitivity to aberration in optical imagingMak, GYH; Lam, EYM; Wong, AKK2003753
Sensitivity of 1D mask features towards aberration in photolithographyMak, GYH; Wong, AKK; Lam, EYM200386
Standard cell layout with grid-placed contactsWang, J; Wong, AKK; Lam, EYM2003100
A study on theoretical representation of intermodulation in CMOS balanced mixersWang, J; Wong, AKK20022,001
Feasibility of 50-nm device manufacture by 157-nm optical lithography: an initial assessmentPong, WT; Wong, AKK2002673
Theoretical discussion on reduced aberration sensitivity of enhanced alternating phase-shifting masksWong, AKK2002707
Quantification of image qualityPong, WT; Wong, AKK2002928
Optimum mask and source patterns to print a given shapeRosenbluth, AE; Bukofsky, S; Fonseca, S; Hibbs, M; Lai, K; Molless, A; Singh, RN; Wong, AKK2002857
Effects of mismatch on CMOS double-balanced mixers: a theoreticalanalysisWang, J; Wong, AKK20011,883
Alternating phase-shifting mask with reduced aberration sensitivity: lithography considerationsWong, AKK; Liebmann, LW; Molless, AF2001644
Aberration measurement using in-situ two-beam interferometryKirk, JP; Kunkel, G; Wong, AKK2001952
Asymmetric biasing for subgrid pattern adjustmentWong, AKK; Liebmann, LW2001554
Tradeoffs in Modified DiscreteCosine Transform implementationsYang, X; Shi, S; Wong, AKK2001531