Results 1 to 8 of 8
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TypeTitleAuthor(s)YearViews
Photoinduced Dehydrogenation of Defects in Undoped a-Si:H Using Positron Annihilation Spectroscopy
Journal:
Physical Review Letters
Publisher:
American Physical Society. The Journal's web site is located at http://prl.aps.org
Zou, X; Chan, YC; Webb, DP; Lam, YW; Hu, YF; Beling, CD; Fung, S; Weng, HM2000445
 
Interface characterization and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annihilation spectroscopy
Proceedings/Conference:
Materials Research Society Symposium - Proceedings
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Chan, YC; Webb, DP; Lam, YW; Chan, FYM; Lin, SH; Hu, YF; Beling, CD; Fung, S199986
 
Identification of vacancy-like defects in high-rate grown a-Si before and after light soaking by VEPAS
Proceedings/Conference:
Materials Research Society Symposium - Proceedings
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Chan, YC; Webb, DP; Lam, YW; Lin, SH; Chan, FYM; Hu, YF; Weng, X; Beling, CD; Fung, S199980
 
Interface characterisation and internal electric field evaluation of a-Si:H pin solar cell by variable energy positron annhilation spectroscopy
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Chan, YC; Webb, DP; Lam, YW; Chan, FYM; Lin, SH; Hu, YF; Beling, CD; Fung, SHY1999440
 
Identification of vacancy-like defects in high-rate grown a-Si before and after ligh soaking by vepas
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Chan, YC; Webb, DP; Lam, YW; Lin, SH; Chan, FYM; Hu, YF; Weng, X; Beling, CD; Fung, SHY1999419
 
Depth profiling of vacancy-type defects in homogenous and multilayered a-Si films by positron beam Doppler broadening
Journal:
Journal of Non-Crystalline Solids
Publisher:
Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jnoncrysol
Zou, X; Webb, DP; Chan, YC; Lam, YW; Hu, YF; Gong, M; Beling, CD; Fung, S199887
 
Probing of microvoids in high-rate deposited α-Si : H thin films by variable energy positron annihilation spectroscopy
Journal:
Journal of Materials Research
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/jmr
Zou, X; Webb, DP; Chan, YC; Lam, YW; Hu, YF; Fung, S; Beling, CD199883
 
Study of microvoids in high-rate a-Si:H using positron annihilation
Publisher:
Materials Research Society. The Journal's web site is located at http://www.mrs.org/publications/epubs/proceedings/spring2004/index.html
Zou, X; Webb, DP; Lin, SH; Lam, YW; Chan, YC; Hu, YF; Beling, CD; Fung, SHY1997364
 
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