Results 1 to 6 of 6
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TypeTitleAuthor(s)YearViews
Charge storage behaviors of ge nanocrystals embedded in SiO 2 for the application in non-volatile memory devices
Proceedings/Conference:
Journal of Nanoscience and Nanotechnology
Publisher:
American Scientific Publishers. The Journal's web site is located at http://aspbs.com/jnn/
Yang, M; Chen, TP; Wong, JI; Liu, Y; Tseng, AA; Fung, S2010228
 
Energy shifts of Si oxidation states in the system of Si nanocrystals embedded in SiO 2 matrix
Journal:
Journal of Nanoscience and Nanotechnology
Publisher:
American Scientific Publishers. The Journal's web site is located at http://aspbs.com/jnn/
Chen, TP; Liu, Y; Sun, CQ; Tseng, AA; Fung, S200790
 
Si ion-induced instability in flatband Voltage of Si/sup +/-implanted gate oxides
Publisher:
IEEE.
Ng, CY; Chen, TP; Ding, L; Chen, Q; Liu, Y; Zhao, P; Tseng, AA; Fung, SHY2006803
 
Influence of Si-nanocrystal distribution in the oxide on the charging behavior of MOS structures
Journal:
IEEE Transactions on Electron Devices
Publisher:
I E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=16
Liu, Y; Chen, TP; Ng, CY; Ding, L; Tse, MS; Fung, S; Tseng, AA2006662
 
Electrical characteristics of Si nanocrystal distributed in a narrow layer in the gate oxide near the gate synthesized with very-low-energy ion beams
Journal:
Journal of Applied Physics
Publisher:
American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Ng, CY; Chen, TP; Zhao, P; Ding, L; Liu, Y; Tseng, AA; Fung, S2006849
 
Influence of silicon-nanocrystal distribution in SiO 2 matrix on charge injection and charge decay
Journal:
Applied Physics Letters
Publisher:
American Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Ng, CY; Chen, TP; Tse, MS; Lim, VSW; Fung, S; Tseng, AA2005585
 
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