| Title | Author(s) | Year | View Count |
 | Accurate And Fast Calculation Of Low Energy Electron Diffractionspectra With Full Crystal Potential | Wu, HS; Wang, J; So, WK; Tong, DSY | 2007 | 131 |
| Emissions from defects in thin GaN epilayers grown on vicinal 4H-SiC substrates | Xu, S; Wang, HJ; Cheung, SH; Li, Q; Dai, X; Xie, MH; Tong, DSY | 2003 | 123 |
| Large excitation-power dependence of pressure coefficients of InxGa1-xN/InyGa1-yN quantum wells | Li, Q; Fang, ZL; Xu, S; Li, GH; Xie, MH; Tong, DSY; Zhang, XH; Liu, W; Chua, SJ | 2003 | 118 |
| Structure determination of the 1x1 GaN(0001) surface by quantitative low energy electron diffraction | Yu, ZX; Tong, DSY; Xu, S; Ma, KMS; Wu, HS | 2003 | 117 |
 | Thermodynamics of carrier distribution within localized electronic states with a broad Gaussian energy distribution and its effect on luminescence behavior of localized states | Li, Q; Xu, SJ; Cheng, WC; Xie, MH; Tong, DSY; Yang, H | 2002 | 280 |
 | GaN thin films on SiC substrates studied using variable energy positron annihilation spectroscopy | Hu, YF; Shan, YY; Beling, CD; Fung, S; Xie, MH; Cheung, SH; Tu, J; Brauer, G; Anwand, W; Tong, DSY | 2001 | 122 |
| The Atomic Structure of Si(111)-(31/2x31/2)R30o-Ga Determined by Automated Tensor Leed | Chen, W; Wu, HS; Ho, WK; Deng, BC; Xu, G; Tong, DSY | 2000 | 115 |
| Multilayer structural determination of the GaAs(1¯1¯1¯)2×2 reconstruction by automated tensor LEED | Deng, BC; Yu, ZX; Xu, G; Mrstik, BJ; Tong, DSY | 1999 | 233 |
| Angle-resolved x-ray circular and magnetic circular dichroisms: Definitions and applications | Tong, DSY; Guo, X; Tobin, JG; Waddill, GD | 1996 | 243 |
| Direct observation of ordered trimers on Si(111)√3×√3 R30°-Au by scanned-energy glancing-angle Kikuchi electron wave-front reconstruction | Hong, IH; Liao, DK; Chou, YC; Wei, CM; Tong, DSY | 1996 | 416 |
| Surface structure of epitaxial Gd(0001) films on W(110) studied by quantitative LEED analysis | Giergiel, J; Pang, AW; Hopster, H; Guo, X; Tong, DSY; Weller, D | 1995 | 254 |
| Initial-state and scattering-factor effects in photoelectron holography | Tong, DSY; Li, H; Huang, H | 1995 | 546 |
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