Results 1 to 7 of 7
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TypeTitleAuthor(s)YearViews
Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFMBeinik, I; Kratzer, M; Wachauer, A; Wang, L; Piryatinski, YP; Brauer, G; Chen, X; Hsu, YF; Djurisic, A; Teichert, C201345
 
Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Lechner, RT; Teichert, C; Motz, C; Anwand, W; Brauer, G; Chen, XY; Hsu, YF; Djurišić, AB201282
 
Electrical properties of ZnO nanorods studied by conductive atomic force microscopyBeinik, I; Kratzer, M; Wachauer, A; Wang, L; Lechner, RT; Teichert, C; Motz, C; Anwand, W; Brauer, G; Chen, XY; Hsu, XY; Djurišić, AB2011153
 
Scanning probe microscopy-based characterization of ZnO nanorodsTeichert, C; Hou, Y; Beinik, I; Chen, X; Hsu, YF; Djurišić, AB; Anwand, W; Brauer, G201074
 
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methodsBrauer, G; Anwand, W; Grambole, D; Egger, W; Sperr, P; Beinik, I; Wang, L; Teichert, C; Kuriplach, J; Lang, J; Zviagin, S; Cizmar, E; Ling, CC; Hsu, YF; Xi, YY; Chen, X; Djurišić, AB; Skorupa, W2009630
 
Non-destructive characterization of vertical ZnO nanorod arrays by slow positron implantation spectroscopy, atomic force microscopy, and photoluminescenceBrauer, G; Anwand, W; Skorupa, W; Beynik, I; Teichert, C; Hsu, YF; Xi, Y; Zhu, C; Ling, FCC; Djurisic, A2008255
 
Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysisBrauer, G; Anwand, W; Grambole, D; Skorupa, W; Hou, Y; Andreev, A; Teichert, C; Tam, KH; Djurišić, AB2007151
 
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