| Title | Author(s) | Year | View Count |  | Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM | Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Piryatinski, YP; Brauer, G; Chen, X; Hsu, YF; Djurisic, A; Teichert, C | 2013 | 5 |
 | Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005)) | Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Lechner, RT; Teichert, C; Motz, C; Anwand, W; Brauer, G; Chen, XY; Hsu, YF; Djurišić, AB | 2012 | 49 |
 | Electrical properties of ZnO nanorods studied by conductive atomic force microscopy | Beinik, I; Kratzer, M; Wachauer, A; Wang, L; Lechner, RT; Teichert, C; Motz, C; Anwand, W; Brauer, G; Chen, XY; Hsu, XY; Djurišić, AB | 2011 | 105 |
| Scanning probe microscopy-based characterization of ZnO nanorods | Teichert, C; Hou, Y; Beinik, I; Chen, X; Hsu, YF; Djurišić, AB; Anwand, W; Brauer, G | 2010 | 60 |
| Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods | Brauer, G; Anwand, W; Grambole, D; Egger, W; Sperr, P; Beinik, I; Wang, L; Teichert, C; Kuriplach, J; Lang, J; Zviagin, S; Cizmar, E; Ling, CC; Hsu, YF; Xi, YY; Chen, X; Djurišić, AB; Skorupa, W | 2009 | 622 |
| Non-destructive characterization of vertical ZnO nanorod arrays by slow positron implantation spectroscopy, atomic force microscopy, and photoluminescence | Brauer, G; Anwand, W; Skorupa, W; Beynik, I; Teichert, C; Hsu, YF; Xi, Y; Zhu, C; Ling, FCC; Djurisic, A | 2008 | 255 |
| Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis | Brauer, G; Anwand, W; Grambole, D; Skorupa, W; Hou, Y; Andreev, A; Teichert, C; Tam, KH; Djurišić, AB | 2007 | 156 |
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