Results 1 to 1 of 1
Page 1 of 1
TypeTitleAuthor(s)YearViews
Electrical reliability and leakage mechanisms in highly resistive multiferroic La0.1Bi0.9FeO3 ceramics
Journal:
Applied Physics Letters
Publisher:
American Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Wang, SY; Qiu, X; Gao, J; Feng, Y; Su, WN; Zheng, JX; Yu, DS; Li, DJ2011941
 
Page 1 of 1
Export Records
Step 1: Select content and export format
  • Citation only
Step 2: Select export method
  • Download