Results 1 to 20 of 26
Page 1 of 2  Next >
TypeTitleAuthor(s)YearViews
Microstructure and micro-Raman studies of nitridation and structure transition of gallium oxide nanowires
Journal:
Materials Characterization
Publisher:
Elsevier Inc. The Journal's web site is located at http://www.elsevier.com/locate/matchar
Ning, JQ; Xu, SJ; Wang, PW; Song, YP; Yu, DP; Shan, YY; Lee, ST; Yang, H2012209
 
418 cm-1 Raman scattering from gallium nitride nanowires: Is it a vibration mode of N-rich Ga-N bond configuration?
Journal:
Applied Physics Letters
Publisher:
American Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Ning, JQ; Xu, SJ; Yu, DP; Shan, YY; Lee, ST2007320
 
Millimeter positron focusing using a hybrid lens design
Proceedings/Conference:
Materials Science Forum
Publisher:
Trans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.net
Cheung, CK; Kwan, PY; Shan, YY; Naik, PS; Weng, HM; Beling, CD; Fung, S2004171
 
Bi-directional phase transition of Cu/6H-SiC(0 0 0 1) system discovered by positron beam study
Proceedings/Conference:
Applied Surface Science
Publisher:
Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/apsusc
Zhang, JD; Weng, HM; Shan, YY; Ching, HM; Beling, CD; Fung, S; Ling, CC2002170
 
A study of the electric field transient at the Au/semi-insulating GaAs contact under an alternating current square-pulse bias
Journal:
Journal of Physics Condensed Matter
Publisher:
Institute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpcm
Ling, CC; Fung, S; Beling, CD; Shan, YY; Deng, AH2002147
 
Application of positron annihilation lifetime technique to the study of deep level transients in semiconductors
Journal:
Journal of Applied Physics
Publisher:
American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Deng, AH; Shan, YY; Fung, S; Beling, CD2002468
 
Positron-annihilation study of compensation defects in InP
Journal:
Journal of Applied Physics
Publisher:
American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Shan, YY; Deng, AH; Ling, CC; Fung, S; Ling, CD; Zhao, YW; Sun, TN; Sun, NF2002308
 
GaN thin films on SiC substrates studied using variable energy positron annihilation spectroscopy
Proceedings/Conference:
Materials Science Forum
Publisher:
Trans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.net
Hu, YF; Shan, YY; Beling, CD; Fung, S; Xie, MH; Cheung, SH; Tu, J; Brauer, G; Anwand, W; Tong, DSY2001157
 
A positron annihilation study of compensation defects responsible for conduction-type conversions in LEC-grown InP
Proceedings/Conference:
Materials Science Forum
Publisher:
Trans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.net
Shan, YY; Deng, AH; Zhao, YW; Ling, CC; Fung, S; Beling, CD2001151
 
On the possible identification of defects using the autocorrelation function approach in double Doppler broadening of annihilation radiation spectroscopy
Journal:
Journal of Physics Condensed Matter
Publisher:
Institute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpcm
Beling, CD; LiMing, W; Shan, YY; Cheung, SH; Fung, S; Panda, BK; Seitsonen, AP1998125
 
Study of DX center in Cd0.8Zn0.2Te:CI by positron annihilation
Journal:
Journal of Applied Physics
Publisher:
American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Fung, S; Shan, YY; Deng, AH; Ling, CC; Beling, CD; Lynn, KG199896
 
Positron-lifetime study of compensation defects in undoped semi-insulating InP
Journal:
Physical Review B - Condensed Matter and Materials Physics
Publisher:
American Physical Society. The Journal's web site is located at http://prb.aps.org/
Beling, CD; Deng, AH; Shan, YY; Zhao, YW; Fung, S; Sun, NF; Sun, TN; Chen, XD1998498
 
The Microscopic Structure of DX Centers in cd0.8Zn0.2Te:Cl
Proceedings/Conference:
Materials Science Forum
Publisher:
Trans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.net
Shan, YY; Lynn, KG; Szeles, C; Asoka-Kumar, P; Thio, T; Bennett, JW; Beling, CD; Fung, SHY; Becla, P1997149
 
Microscopic structure of DX centers in Cd 0.8Zn 0.2Te:Cl
Journal:
Physical Review Letters
Publisher:
American Physical Society. The Journal's web site is located at http://prl.aps.org
Shan, YY; Lynn, KG; Szeles, Cs; AsokaKumar, P; Thio, T; Bennett, JW; Beling, CB; Fung, S; Becla, P1997103
 
Microscopic Structure of DX Centers in Cd0.8Zn0.2Te:Cl
Publisher:
American Physical Society. The Journal's web site is located at http://prl.aps.org
Shan, YY; Lynn, KG; Szeles, C; Asoka-Kumar, P; Thio, T; Bennett, JW; Beling, CD; Fung, SHY; Becla, P1997626
 
EL2 deep-level transient study in semi-insulating GaAs using positron-lifetime spectroscopy
Journal:
Physical Review B - Condensed Matter and Materials Physics
Publisher:
American Physical Society. The Journal's web site is located at http://prb.aps.org/
Shan, YY; Ling, CC; Deng, AH; Panda, BK; Beling, CD; Fung, S1997362
 
Low-temperature positron transport in semi-insulating GaAs
Journal:
Physical Review B - Condensed Matter and Materials Physics
Publisher:
American Physical Society. The Journal's web site is located at http://prb.aps.org/
Shan, YY; Lynn, KG; AsokaKumar, P; Fung, S; Beling, CB1997520
 
The microscopic structure of DX centers in Cd 0.8Zn 0.2Te:Cl
Journal:
Materials Science Forum
Publisher:
Trans Tech Publications Ltd. The Journal's web site is located at http://www.scientific.net
Shan, YY; Lynn, KG; Szeles, Cs; AsokaKumar, P; Thio, T; Bennett, JW; Beling, CB; Fung, S; Becla, P199794
 
Field effect on positron diffusion in semi-insulating GaAs
Journal:
Physical Review B - Condensed Matter and Materials Physics
Publisher:
American Physical Society. The Journal's web site is located at http://prb.aps.org/
Shan, YY; AsokaKumar, P; Lynn, KG; Fung, S; Beling, CD1996454
 
Doppler-broadening measurements of microvoids at the Au/GaAs interface
Journal:
Applied Physics A Materials Science & Processing
Publisher:
Springer Verlag. The Journal's web site is located at http://link.springer.de/link/service/journals/00339/index.htm
Ling, CC; Shan, YY; Panda, BK; Fleischer, S; Beling, CD; Fung, S1995132
 
Page 1 of 2  Next >
Export Records
Step 1: Select content and export format
  • Citation only
Step 2: Select export method
  • Download