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TypeTitleAuthor(s)YearViews
On the T2 trap in zinc oxide thin filmsSchmidt, M; Ellguth, M; Karsthof, R; v Wenckstern, H; Pickenhain, R; Grundmann, M; Brauer, G; Ling, FCC2012116
 
Defects in zinc-implanted ZnO thin filmsSchmidt, M; Ellguth, M; Czekalla, C; V Wenckstern, H; Pickenhain, R; Grundmann, M; Brauer, G; Skorupa, W; Helm, M; Gu, Q; Ling, CC2009622
 
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