| Title | Author(s) | Year | View Count |  | Predictive factors and radiological features of radiation-induced cranial nerve palsy in patients with nasopharyngeal carcinoma following radical radiotherapy | Luk, YS; Shum, JSF; Sze, HCK; Chan, LLK; Ng, WT; Lee, AWM | 2013 | 36 |
| The strength/weakness of the AJCC/UICC staging system (7th edition) for nasopharyngeal cancer and suggestions for future improvement | Lee, AWM; Ng, WT; Chan, LK; Chan, OSH; Hung, WM; Chan, CC; Cheng, PTC; Sze, H; Lam, TS; Yau, TK | 2012 | 45 |
| Radical radiotherapy for nasopharyngeal carcinoma in elderly patients: The importance of co-morbidity assessment | Sze, HCK; Ng, WT; Chan, OSH; Shum, TCY; Chan, LLK; Lee, AWM | 2012 | 45 |
 | Evaluation of micro-RNA biomarker panel on biopsies and non-invasive samples in nasopharyngeal carcinoma | Szeto, CYY; Kwong, DLW; Lee, A; Ng, WT; Lee, VHF; Lung, ML | 2012 | 61 |
| The battle against nasopharyngeal cancer | Lee, AWM; Ng, WT; Chan, YH; Sze, H; Chan, C; Lam, TH | 2012 | 56 |
 | Cost-analysis of XELOX and FOLFOX4 for treatment of colorectal cancer to assist decision-making on reimbursement | Tse, VC; Ng, WT; Lee, V; Lee, AWM; Chua, DTT; Chau, J; McGhee, SM | 2011 | 156 |
| Cost-analysis of XELOX and FOLFOX4 for treatment of colorectal cancer in Hong Kong (abstract) | Chau, J; Tse, VC; Ng, WT; Lee, VHF; Lee, AWM; Chua, DTT; McGhee, S | 2011 | 113 |
| Trends and Patterns of Breast Conservation Treatment in Hong Kong: 1994-2007 | Yau, TK; Soong, IS; Sze, H; Choi, CW; Yeung, MW; Ng, WT; Lee, AWM | 2009 | 34 |
| Melatonin slowed the early biochemical progression of hormone-refractory prostate cancer in a patient whose prostate tumor tissue expressed MT 1 receptor subtype | Shiu, SYW; Law, IC; Lau, KW; Tam, PC; Yip, AWC; Ng, WT | 2003 | 67 |
| RTP formed oxynitride via direct nitridation in N 2 | Khoueir, A; Lu, ZH; Ng, WT; Tay, SP; Lai, PT | 2000 | 195 |
| A new lateral trench-gate conductivity modulated power transistor | Cai, J; Sin, JKO; Mok, PKT; Ng, WT; Lai, PT | 1999 | 515 |
| AC hot-carrier-induced degradation in NMOSFET's with N 2O-based gate dielectrics | Zeng, X; Lai, PT; Ng, WT | 1997 | 775 |
| Effects of backsurface Ar+ bombardment on n-MOSFET's with nitride gate oxides | Lai, PT; Zeng, X; Li, GQ; Ng, WT | 1997 | 81 |
| A novel technique of N2O-treatment on NH3-nitrided oxide as gate dielectric for nMOS transistors | Zeng, X; Lai, PT; Ng, WT | 1996 | 657 |
| Off-state gate leakage current in N-channel MOSFETs with gate dielectrics prepared by different techniques | Zeng, X; Lai, PT; Ng, WT | 1995 | 746 |
| Charge trapping properties of N2O-treatedNH3-nitrided oxides under high-field stress | Zeng, X; Lai, PT; Ng, WT | 1995 | 642 |
| Latch-up characteristics of a trench-gate conductivity modulatedpower transistor | Jun, C; Sin, KO; Ng, WT; Lai, PT | 1995 | 460 |
| Mobility improvement of n-MOSFET's with nitrided gate oxide by backsurface Ar+ bombardment | Lai, PT; Xu, Zeng; Li, GQ; Ng, WT | 1995 | 441 |
| Enhanced off-state leakage currents in n-channel MOSFET's with N2O-grown gate dielectric | Xu, Z; Lai, PT; Ng, WT | 1995 | 687 |
| Off-state leakage current in n-channel MOSFET's with gate dielectrics prepared by different techniques | Xu, Z; Lai, PT; Ng, WT | 1995 | 180 |
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