Browsing by Author Liu, BY

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TitleAuthor(s)Issue DateViews
 
2005
104
 
2007
54
 
2013
32
 
2015
53
 
2009
44
 
2012
74
 
2008
57
 
1995
85
 
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
22
 
2014
63
 
Extending the CONSORT Statement to moxibustion
Journal:Journal of Chinese Integrative Medicine
2013
43
 
Fluctuation effects on the transport properties of unitary Fermi gases
Journal:Physical Review A (Atomic, Molecular and Optical Physics)
2014
41
 
2003
114
 
Improvement of channel-current-induced gate-oxide breakdown in n-MOSFET's using rapid thermal nitridation
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
19
 
1998
40
 
1997
98
 
Interface-state-induced degradation of GIDL current in n-MOSFETsunder hot-carrier stress
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1996
62
 
On recovery of hot-carrier-induced mobility degradationin off-state thermally-nitrided-oxide N-MOSFET's
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
16
 
Preventing fissure caries by sealant and fluorides: 12-month results
Proceeding/Conference:Journal of Dental Research
2009
63
 
2015
31