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TypeTitleAuthor(s)YearViews
Split-Drain Magnetic Field-Effect Transistor Channel Charge Trapping and Stress Induced Sensitivity Deterioration
Proceedings/Conference:
IEEE Transactions on Magnetics
Yang, Z; Siu, SL; Tam, WS; Kok, CW; Leung, CW; Lai, PT; Wong, H; Tang, WM; Pong, PWT201388
 
Transient sensitivity of sectorial split-drain magnetic field-effect transistor
Journal:
IEEE Transactions on Magnetics
Publisher:
Institute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20
Yang, Z; Siu, S; Tam, W; Kok, C; Leung, CW; Lai, PT; Wong, H; Pong, PWT201371
 
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