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Transient sensitivity of sectorial split-drain magnetic field-effect transistor
IEEE Transactions on Magnetics
Institute of Electrical and Electronics Engineers. The Journal's web site is located at
Yang, Z; Siu, S; Tam, W; Kok, C; Leung, CW; Lai, PT; Wong, H; Pong, PWT201391
Split-Drain Magnetic Field-Effect Transistor Channel Charge Trapping and Stress Induced Sensitivity Deterioration
IEEE Transactions on Magnetics
Yang, Z; Siu, SL; Tam, WS; Kok, CW; Leung, CW; Lai, PT; Wong, H; Tang, WM; Pong, PWT2013101
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