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TypeTitleAuthor(s)YearViews
Influence of TCE concentration in thermal oxidation on reliability of SiC MOS capacitors under Fowler-Nordheim electron injection
Journal:
Microelectronics Reliability
Publisher:
Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/microrel
Yang, BL; Kwok, PCK; Lai, PT200682
 
An analytical two-dimensional model for circular spreading-resistance temperature sensor based on thin silicon film
Journal:
Solid-State Electronics
Publisher:
Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/sse
Wu, ZH; Lai, PT; Li, B; Kwok, PCK; Liu, BY; Zheng, XR2005280
 
Brain tumor boundary detection in MR image with generalized fuzzy operator
Publisher:
IEEE.
Leung, CC; Chen, WF; Kwok, PCK; Chan, FHY2003705
 
Enhanced reliability for low-temperature gate dielectric of MOS devices by N2O or NO plasma nitridation
Journal:
Microelectronics Reliability
Publisher:
Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/microrel
Or, DCT; Lai, PT; Sin, JKO; Kwok, PCK; Xu, JP2003131
 
Off-line signature verification by the tracking of feature and stroke positions
Journal:
Pattern Recognition
Publisher:
Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/pr
Fang, B; Leung, CH; Tang, YY; Tse, KW; Kwok, PCK; Wong, YK2003167
 
Off-line signature verification with generated training samples
Journal:
I E E Proceedings - Vision, Image and Signal Processing
Fang, B; Leung, CH; Tang, YY; Kwok, PCK; Tse, KW; Wong, YK2002190
 
Offline signature verification with generated training samples
Proceedings/Conference:
IEE Proceedings: Vision, Image and Signal Processing
Fang, B; Leung, CH; Tang, YY; Kwok, PCK; Tse, KW; Wong, YK2002141
 
Normalization of contrast in document images using generalized fuzzy operator with least square method
Proceedings/Conference:
Proceedings - International Conference on Pattern Recognition
Publisher:
IEEE, Computer Society.
Leung, CC; Kwok, PCK; Chan, FHY; Tsui, WK2002682
 
MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC
Journal:
Microelectronics Reliability
Publisher:
Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/microrel
Chakraborty, S; Lai, PT; Kwok, PCK2002175
 
Recognition of Chinesed Bank Cheque Amounts
Journal:
International journal On Document Analysis and Recognition
Publisher:
Springer Verlag. The Journal's web site is located at http://link.springer.de/link/service/journals/10032/index.htm
Yu, ML; Kwok, PCK; Leung, CH2001161
 
Offline signature verification by the analysis of cursive strokes
Journal:
International Journal of Pattern Recognition and Artificial Intelligence
Publisher:
World Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/ijprai/ijprai.shtml
Fang, B; Wang, YY; Leung, CH; Tse, KW; Tang, YY; Kwok, PCK; Wong, YK2001135
 
A Peripheral Feature Based Approach for Off-line Signature Verification
Proceedings/Conference:
Proceedings of the Joint Conference on Information Sciences
Fang, B; Leung, CH; Tang, YY; Kwok, PCK; Tse, KW; Wong, YK200099
 
A Peripheral Feafure Based Approach for Off-line Signature Verification
Proceedings/Conference:
3rd International Conference on Computer Vision, Pattern Recognition and Image Processing
Fang, B; Leung, CH; Tang, YY; Kwok, PCK; Tse, KW; Wong, YK2000118
 
Thyroid cancer cells boundary location by a fuzzy edge detection method
Publisher:
IEEE, Computer Society.
Leung, CC; Chan, FHY; Lam, KY; Kwok, PCK; Chen, WF2000329
 
A smoothness Index-based approach for off-line signature verification
Proceedings/Conference:
Proceedings of ICDAR'99, the 5th International Conference on Document Analysis and Recognition
Fang, B; Wang, YY; Leung, CH; Tang, YY; Kwok, PCK; Tse, KW; Wong, YK1999162
 
MPSK DS/CDMA carrier recovery and tracking based on correlation technique
Journal:
Electronics Letters
Publisher:
The Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL
Hu, AQ; Kwok, PCK; Ng, TS1999169
 
Modeling the optical constants of Al xGa 1-xAs alloys
Journal:
Journal of Applied Physics
Publisher:
American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Djurišić, AB; Rakić, AD; Kwok, PCK; Li, EH; Majewski, ML; Elazar, JM199995
 
Modeling the optical constants of GaP, InP, and InAs
Journal:
Journal of Applied Physics
Publisher:
American Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Djurišić, AB; Rakić, AD; Kwok, PCK; Li, EH; Majewski, ML1999458
 
RLS adaptive blind beamforming algorithm for cyclostationary signals
Journal:
Electronics Letters
Publisher:
The Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL
Chen, YX; He, ZY; Ng, TS; Kwok, PCK1999163
 
A smoothness index based approach for off-line signature verificaiton
Proceedings/Conference:
The Fifth International Conference on Document Anaysis and Recognition
Fang, B; Leung, CH; Tang, YY; Kwok, PCK; Tse, KW; Wong, YK1999104
 
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