| Title | Author(s) | Year | View Count |
 | Regularized multiframe phase-shifting algorithm for three-dimensional profilometry | Deng, F; Sze, WF; Deng, J; Fung, KSM; Leung, WH; Lam, EY | 2012 | 100 |
 | An illumination-invariant phase-shifting algorithm for three-dimensional profilometry | Deng, F; Liu, C; Sze, W; Deng, J; Fung, KSM; Leung, WH; Lam, EY | 2012 | 71 |
| Height inspection of wafer bumps without explicit 3-D reconstruction | Dong, M; Chung, R; Lam, EY; Fung, KSM | 2010 | 48 |
| An edge detection algorithm based on rectangular gaussian kernels for machine vision applications | Deng, F; Fung, KSM; Deng, J; Lam, EY | 2009 | 242 |
| Handling of multi-reflections in wafer bump 3D reconstruction | Cheng, J; Chung, R; Lam, EY; Fung, KSM | 2008 | 168 |
| Structured-light based sensing using a single fixed fringe grating: Fringe boundary detection and 3-D reconstruction | Cheng, J; Chung, CKR; Lam, EY; Fung, KSM; Wang, F; Leung, WH | 2008 | 459 |
| Projection optics design for tilted projection of fringe patterns | Shu, Y; Chung, R; Tan, Z; Cheng, J; Lam, EY; Fung, KSM; Wang, F | 2008 | 301 |
| Erratum: Projection optics design for tilted projection of fringe patterns (Optical Engineering (2008) 47 (053002)) | Shu, Y; Chung, R; Tan, Z; Cheng, J; Lam, EY; Fung, KSM; Wang, F | 2008 | 42 |
| Bit-pairing codification for binary pattern projection system | Cheng, J; Chung, R; Lam, EY; Fung, KSM | 2006 | 410 |
| A novel design of grating projection system for 3D reconstruction of wafer bumps | Shu, Y; Chung, R; Tan, Z; Cheng, J; Lam, EY; Fung, KSM; Wang, F | 2006 | 84 |
| Boundary detection of projected fringes on surface with inhomogeneous reflectance function | Cheng, J; Chung, R; Lam, EY; Fung, KSM; Wang, F; Leung, WH | 2006 | 53 |
| Reference-free detection of semiconductor assembly defect | Ng, ANY; Lam, EY; Chung, R; Fung, KSM; Leung, WH | 2005 | 718 |
| Three-dimensional reconstruction of wafer solder bumps using binary pattern projection | Cheng, J; Chung, R; Lam, EY; Fung, KSM; Wang, F; Leung, WH | 2005 | 738 |
 | Automatic Segmentation For Visual Inspection In Semiconductor Manufacturing Using Multiscale Morphology | Ng, NY; Lam, EYM; Chung, R; Fung, KSM; Leung, WH | 2005 | 119 |
| Fast measurement of SEP for monitoring spinal cord during scoliosis | Fung, KSM; Du, MH; Liu, WQ; Chan, FHY; Lam, FK; Luk, DK; Hu, Y | 1998 | 391 |
| Intraoperative monitoring of somatosensory evoked potential in the spinal cord rectification operation by means of wavelet analysis | Liu, W; Du, MH; Chan, FHY; Lam, FK; Luk, DK; Hu, Y; Fung, KSM; Qiu, W | 1998 | 46 |
| Adaptive neural network filter for visual evoked potential estimation | Fung, KSM; Lam, FK; Chan, FHY; Poon, PWF; Liu, JG | 1995 | 371 |
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