Browsing by Author Fung, KSM

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TitleAuthor(s)Issue DateViews
 
1995
49
 
An edge-from-focus approach to 3D inspection and metrology
Proceeding/Conference:Proceedings of SPIE
2015
22
 
Automatic Segmentation For Visual Inspection In Semiconductor Manufacturing Using Multiscale Morphology
Proceeding/Conference:7th International Conference on Quality Control by Artificial Vision
2005
47
 
Bit-pairing codification for binary pattern projection system
Proceeding/Conference:Proceedings - International Conference on Pattern Recognition
2006
56
Boundary detection of projected fringes on surface with inhomogeneous reflectance function
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2006
45
An edge detection algorithm based on rectangular gaussian kernels for machine vision applications
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2009
85
An elliptic phase-shifting algorithm for high speed three-dimensional profilometry
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2013
39
 
2008
40
 
Fast measurement of SEP for monitoring spinal cord during scoliosis
Proceeding/Conference:IEEE Engineering in Medicine and Biology Society Conference Proceedings
1998
55
Handling of multi-reflections in wafer bump 3D reconstruction
Proceeding/Conference:Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
2008
62
 
Height inspection of wafer bumps without explicit 3-D reconstruction
Journal:IEEE Transactions on Electronics Packaging Manufacturing
2010
63
An illumination-invariant phase-shifting algorithm for three-dimensional profilometry
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2012
76
1998
58
A novel design of grating projection system for 3D reconstruction of wafer bumps
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2006
54
A polynomial phase-shift algorithm for high precision three-dimensional profilometry
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2013
54
 
2008
73
 
Reference-free detection of semiconductor assembly defect
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2005
68
 
2012
96
 
2008
67
 
A three-dimensional imaging system for surface profilometry of moving objects
Proceeding/Conference:IEEE International Workshop on Imaging Systems and Techniques Proceedings
2013
31