Results 1 to 20 of 20
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TypeTitleAuthor(s)YearViews
An elliptic phase-shifting algorithm for high speed three-dimensional profilometry
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
Society of Photo-Optical Instrumentation Engineers (SPIE). The Journal's web site is located at http://www.spie.org/app/Publications/index.cfm?fuseaction=proceedings
Deng, F; Li, Z; Chen, J; Deng, J; Fung, KSM; Lam, EY201378
 
A three-dimensional imaging system for surface profilometry of moving objects
Proceedings/Conference:
IEEE International Workshop on Imaging Systems and Techniques Proceedings
Publisher:
IEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001148
Deng, F; Liu, J; Deng, J; Fung, KSM; Lam, EY20136
 
A polynomial phase-shift algorithm for high precision three-dimensional profilometry
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
Society of Photo-Optical Instrumentation Engineers (SPIE). The Journal's web site is located at http://www.spie.org/app/Publications/index.cfm?fuseaction=proceedings
Deng, F; Liu, C; Sze, W; Deng, J; Fung, KSM; Lam, EY201373
 
An illumination-invariant phase-shifting algorithm for three-dimensional profilometry
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Deng, F; Liu, C; Sze, W; Deng, J; Fung, KSM; Leung, WH; Lam, EY2012141
 
Regularized multiframe phase-shifting algorithm for three-dimensional profilometry
Journal:
Applied Optics
Publisher:
Optical Society of America. The Journal's web site is located at http://ao.osa.org/journal/ao/about.cfm
Deng, F; Sze, WF; Deng, J; Fung, KSM; Leung, WH; Lam, EY2012166
 
Height inspection of wafer bumps without explicit 3-D reconstruction
Journal:
IEEE Transactions on Electronics Packaging Manufacturing
Dong, M; Chung, R; Lam, EY; Fung, KSM201092
 
An edge detection algorithm based on rectangular gaussian kernels for machine vision applications
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Deng, F; Fung, KSM; Deng, J; Lam, EY2009271
 
Handling of multi-reflections in wafer bump 3D reconstruction
Proceedings/Conference:
Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
Cheng, J; Chung, R; Lam, EY; Fung, KSM2008209
 
Erratum: Projection optics design for tilted projection of fringe patterns (Optical Engineering (2008) 47 (053002))
Journal:
Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe
Shu, Y; Chung, R; Tan, Z; Cheng, J; Lam, EY; Fung, KSM; Wang, F200895
 
Projection optics design for tilted projection of fringe patterns
Journal:
Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://www.spie.org/oe
Shu, Y; Chung, R; Tan, Z; Cheng, J; Lam, EY; Fung, KSM; Wang, F2008311
 
Structured-light based sensing using a single fixed fringe grating: Fringe boundary detection and 3-D reconstruction
Journal:
IEEE Transactions on Electronics Packaging Manufacturing
Publisher:
IEEE.
Cheng, J; Chung, CKR; Lam, EY; Fung, KSM; Wang, F; Leung, WH2008461
 
A novel design of grating projection system for 3D reconstruction of wafer bumps
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Shu, Y; Chung, R; Tan, Z; Cheng, J; Lam, EY; Fung, KSM; Wang, F2006176
 
Boundary detection of projected fringes on surface with inhomogeneous reflectance function
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Cheng, J; Chung, R; Lam, EY; Fung, KSM; Wang, F; Leung, WH2006102
 
Bit-pairing codification for binary pattern projection system
Proceedings/Conference:
Proceedings - International Conference on Pattern Recognition
Publisher:
IEEE, Computer Society.
Cheng, J; Chung, R; Lam, EY; Fung, KSM2006432
 
Automatic Segmentation For Visual Inspection In Semiconductor Manufacturing Using Multiscale Morphology
Proceedings/Conference:
7th International Conference on Quality Control by Artificial Vision
Ng, NY; Lam, EYM; Chung, R; Fung, KSM; Leung, WH2005154
 
Three-dimensional reconstruction of wafer solder bumps using binary pattern projection
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Cheng, J; Chung, R; Lam, EY; Fung, KSM; Wang, F; Leung, WH2005739
 
Reference-free detection of semiconductor assembly defect
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Ng, ANY; Lam, EY; Chung, R; Fung, KSM; Leung, WH2005727
 
Intraoperative monitoring of somatosensory evoked potential in the spinal cord rectification operation by means of wavelet analysis
Proceedings/Conference:
Proceedings of SPIE - The International Society for Optical Engineering
Publisher:
S P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Liu, W; Du, MH; Chan, FHY; Lam, FK; Luk, DK; Hu, Y; Fung, KSM; Qiu, W199894
 
Fast measurement of SEP for monitoring spinal cord during scoliosis
Proceedings/Conference:
Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
Publisher:
IEEE.
Fung, KSM; Du, MH; Liu, WQ; Chan, FHY; Lam, FK; Luk, DK; Hu, Y1998375
 
Adaptive neural network filter for visual evoked potential estimation
Publisher:
IEEE.
Fung, KSM; Lam, FK; Chan, FHY; Poon, PWF; Liu, JG1995403
 
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