Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
1/f noise behaviors of NO-nitrided n-MOSFETs
Journal:Solid-State Electronics
2001
258
 
1999
2699
 
1998
765
 
An analysis on stress-induced degradation of 1/f noise in n-MOSFETs
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
41
 
1984
157
 
1984
21
 
2012
192
 
2006
136
 
2008
253
 
2009
221
 
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Semiconductor Device Research Symposium, ISDRS-91
1991
30
 
1990
169
 
1990
167
 
2000
186
 
2002
176
 
1994
195
 
1998
690
 
1998
119
 
1985
104
 
Computer simulation of rapid thermal annealing of thermally grown oxide in ammonia ambient
Proceeding/Conference:Tech.Digest of 1989 International Conference on VLSI and CAD, Seoul
1989
20