Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
1/f noise behaviors of NO-nitrided n-MOSFETs
Journal:Solid-State Electronics
2001
275
 
1999
2706
 
1998
769
 
An analysis on stress-induced degradation of 1/f noise in n-MOSFETs
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
43
 
1984
165
 
1984
22
 
2012
203
 
2006
140
 
2008
262
 
2009
227
 
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Semiconductor Device Research Symposium, ISDRS-91
1991
31
 
1990
173
 
1990
177
 
2000
199
 
2002
185
 
1994
201
 
1998
694
 
1998
128
 
1985
107
 
Computer simulation of rapid thermal annealing of thermally grown oxide in ammonia ambient
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
1989
23