Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
1/f noise behaviors of NO-nitrided n-MOSFETs
Journal:Solid-State Electronics
2001
125
 
1999
1016
 
1998
61
 
An analysis on stress-induced degradation of 1/f noise in n-MOSFETs
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
22
 
1984
45
 
1984
24
 
2012
68
 
2006
48
 
2008
95
 
2009
74
 
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Semiconductor Device Research Symposium, ISDRS-91
1991
20
 
1990
63
 
1990
95
 
2000
122
 
2002
63
 
1994
62
 
A comparison between NO-annealed O2- and N2O-grown gate dielectrics
Proceeding/Conference:IEEE Hong Kong Electron Devices Meeting Proceedings
1998
97
 
1998
46
 
1985
33
 
Computer simulation of rapid thermal annealing of thermally grown oxide in ammonia ambient
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
1989
26