Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
78
 
2005
67
 
2002
99
 
1993
58
 
2009
78
 
1995
90
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
45
 
1994
82
 
2010
65
 
2007
59
 
2008
42
 
2006
72
 
2004
72
 
2006
60
 
2009
194
 
2009
72
 
2011
73
 
2012
157
 
2004
87
 
1993
53