Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
86
 
2005
68
 
2002
102
 
1993
58
 
2009
79
 
1995
93
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
46
 
1994
85
 
2010
66
 
2007
64
 
2008
43
 
2006
74
 
2004
75
 
2006
62
 
2009
200
 
2009
75
 
2011
74
 
2012
158
 
2004
89
 
1993
55