Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
558
 
2005
183
 
2002
1262
 
1993
89
 
2009
388
 
1995
771
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
183
 
1994
1027
2010
274
 
2007
618
 
2008
146
 
2006
837
 
2004
1108
 
2006
525
 
2009
422
 
2009
947
 
2011
238
 
2012
278
 
2004
256
 
1993
88