Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
564
 
2005
184
 
2002
1267
 
1993
91
 
2009
398
 
1995
777
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
185
 
1994
1030
2010
280
 
2007
622
 
2008
163
 
2006
842
 
2004
1113
 
2006
533
 
2009
443
 
2009
951
 
2011
247
 
2012
283
 
2004
266
 
1993
92