Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
71
 
2005
59
 
2002
95
 
1993
47
 
2009
69
 
1995
83
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
36
 
1994
75
 
2010
58
 
2007
53
 
2008
36
 
2006
59
 
2004
65
 
2006
54
 
2009
183
 
2009
65
 
2011
67
 
2012
149
 
2004
72
 
1993
46