Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
88
 
2005
64
 
2002
211
 
1993
43
 
2009
102
 
1995
120
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
42
 
1994
186
 
2010
74
 
2007
79
 
2008
33
 
2006
115
 
2004
170
 
2006
93
 
2009
208
 
2009
165
 
2011
75
 
2012
145
 
2004
78
 
1993
43