Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
71
 
2005
60
 
2002
95
 
1993
49
 
2009
69
 
1995
85
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
36
 
1994
75
 
2010
59
 
2007
55
 
2008
36
 
2006
65
 
2004
66
 
2006
54
 
2009
184
 
2009
65
 
2011
67
 
2012
150
 
2004
73
 
1993
47