Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
299
 
2005
98
 
2002
410
 
1993
23
 
2009
144
 
1995
337
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
45
 
1994
419
 
2010
61
 
2007
250
 
2008
18
 
2006
303
 
2004
375
 
2006
253
 
2009
269
 
2009
674
 
2011
57
 
2012
78
 
2004
103
 
1993
26