Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
90
 
2005
68
 
2002
215
 
1993
45
 
2009
104
 
1995
122
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
42
 
1994
188
 
2010
74
 
2007
80
 
2008
34
 
2006
117
 
2004
172
 
2006
95
 
2009
210
 
2009
167
 
2011
76
 
2012
147
 
2004
80
 
1993
45