Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
77
 
2005
56
 
2002
204
 
1993
33
 
2009
97
 
1995
113
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
39
 
1994
178
 
2010
68
 
2007
73
 
2008
27
 
2006
107
 
2004
161
 
2006
86
 
2009
201
 
2009
158
 
2011
68
 
2012
90
 
2004
69
 
1993
38