Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
299
 
2005
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2002
410
 
1993
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2009
 
1995
337
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
45
 
1994
 
2010
61
 
2007
 
2008
 
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2006
 
2009
269
 
2009
 
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2012
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1993