Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
66
 
2005
51
 
2002
184
 
1993
29
 
2009
92
 
1995
109
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
36
 
1994
173
 
2010
65
 
2007
70
 
2008
24
 
2006
103
 
2004
156
 
2006
80
 
2009
194
 
2009
154
 
2011
66
 
2012
88
 
2004
58
 
1993
31