Results 21 to 38 of 38
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TypeTitleAuthor(s)YearViews
Depth profiling of charging effect of Si nanocrystals embedded in SiO2: A study of charge diffusion among Si nanocrystalsLiu, Y; Chen, TP; Ng, CY; Ding, L; Zhang, S; Fu, YQ; Fung, S2006180
 
Influence of the carrier gas on the luminescence of ZnO tetrapod nanowiresLeung, CY; Djurišić, AB; Leung, YH; Ding, L; Yang, CL; Ge, WK2006160
 
Defects in ZnO nanorods prepared by a hydrothermal methodTam, KH; Cheung, CK; Leung, YH; Djurišić, AB; Ling, CC; Beling, CD; Fung, S; Kwok, WM; Chan, WK; Phillips, DL; Ding, L; Ge, WK2006273
 
Memory characteristics of MOSFETs with densely stacked silicon nanocrystal layers in the gate oxide synthesized by low-energy ion beamNg, CY; Chen, TP; Ding, L; Fung, S2006872
 
Charging effect on current conduction in aluminum nitride thin films containing Al nanocrystalsLiu, Y; Chen, TP; Lau, HW; Wong, JI; Ding, L; Zhang, S; Fung, S2006769
 
Electrical characteristics of Si nanocrystal distributed in a narrow layer in the gate oxide near the gate synthesized with very-low-energy ion beamsNg, CY; Chen, TP; Zhao, P; Ding, L; Liu, Y; Tseng, AA; Fung, S2006818
 
Influence of Si nanocrystal distributed in the gate oxide on the MOS capacitanceNg, CY; Chen, TP; Ding, L; Yang, M; Wong, JI; Zhao, P; Yang, XH; Liu, KY; Tse, MS; Trigg, AD; Fung, S2006967
 
Dielectric functions of densely stacked Si nanocrystal layer embedded in SiO 2 thin filmsDing, L; Chen, TP; Wong, JI; Yang, M; Liu, Y; Ng, CY; Liu, YC; Tung, CH; Trigg, AD; Fung, S2006629
 
Static dielectric constant of isolated silicon nanocrystals embedded in a SiO 2 thin filmNg, CY; Chen, TP; Ding, L; Liu, Y; Tse, MS; Fung, S; Dong, ZL2006654
 
Charging mechanism in a SiO 2 matrix embedded with Si nanocrystalsLiu, Y; Chen, TP; Ding, L; Zhang, S; Fu, YQ; Fung, S2006471
 
Si ion-induced instability in flatband Voltage of Si/sup +/-implanted gate oxidesNg, CY; Chen, TP; Ding, L; Chen, Q; Liu, Y; Zhao, P; Tseng, AA; Fung, SHY2006723
 
Green, yellow, and orange defect emission from ZnO nanostructures: Influence of excitation wavelengthDjurišić, AB; Leung, YH; Tam, KH; Ding, L; Ge, WK; Chen, HY; Gwo, S2006572
 
Influence of Si-nanocrystal distribution in the oxide on the charging behavior of MOS structuresLiu, Y; Chen, TP; Ng, CY; Ding, L; Tse, MS; Fung, S; Tseng, AA2006625
 
Defect emissions in ZnO nanostructuresDjurišić, AB; Leung, YH; Tarn, KH; Ding, L; Ge, WK; Chan, WK2005216
 
An approach to optical-property profiling of a planar-waveguide structure of Si nanocrystals embedded in SiO2Ding, L; Chen, TP; Liu, Y; Ng, CY; Fung, S2005161
 
Optical properties of silicon nanocrystals embedded in a SiO2 matrixDing, L; Chen, TP; Liu, Y; Ng, CY; Fung, S2005141
 
Thermal annealing effect on the band gap and dielectric functions of silicon nanocrystals embedded in SiO 2 matrixDing, L; Chen, TP; Liu, Y; Ng, CY; Liu, YC; Fung, S2005641
 
Intelligent approaches for generating assembly drawings from 3-D computer models of mechanical productsChen, KZ; Feng, XA; Ding, L200297
 
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