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Browsing by Author Zeng, SH
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Showing results 5 to 14 of 14
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Title
Author(s)
Issue Date
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A humidity-sensing model for metal-insulator-semiconductor capacitors with porous ceramic film
Journal:
Journal of Applied Physics
Li, GQ
Lai, PT
Huang, MQ
Zeng, SH
Li, B
Cheng, YC
2000
197
Influence of backsurface argon bombardment on SiO2-Si interface characteristics
Journal:
Applied Physics Letters
Lai, PT
Huang, MQ
Zeng, X
Zeng, SH
Li, GQ
1996
A new multi-function thin-film microsensor based on Ba1-xLaxTiO3
Journal:
Smart Materials and Structures
Li, B
Lai, PT
Li, GQ
Zeng, SH
Huang, MQ
2000
177
New thin-film humidity and thermal micro-sensor with Al/SrNbxTi1-xO3/SiO2/Si structure
Journal:
Sensors and Actuators, A: Physical
Li, GQ
Lai, PT
Zeng, SH
Huang, MQ
Li, B
1999
138
Photo-, thermal and humidity sensitivity characteristics of sr1-xLaxTiO3 film on SiO2/Si substrate
Journal:
Sensors and Actuators, A: Physical
Li, GQ
Lai, PT
Zeng, SH
Huang, MQ
Cheng, YC
1997
122
Photoelectrical properties of Ba1-xLaxTiO3 thin-film resistor
Journal:
Sensors and Actuators, A: Physical
Li, B
Lai, PT
Li, GQ
Zeng, SH
Huang, MQ
2000
198
Sensing properties of Ba1-xLaxNbyTi1-yO3 (x=0.25%, y=0.25%) thin-film on SiO2/Si substrate
Journal:
Materials Research Society Symposium - Proceedings
Li, B
Lai, PT
Li, GQ
Zeng, SH
Huang, MQ
2001
106
A study of various oxide/silicon interfaces by Ar + backsurface bombardment
Journal:
Journal of Applied Physics
Lai, PT
Li, GQ
Huang, MQ
Zeng, SH
Cheng, YC
1999
183
Suppression of hot-electron-induced interface degradation in metal-oxide-semiconductor devices by backsurface argon bombardment
Journal:
Microelectronics Reliability
Huang, MQ
Lai, PT
Xu, JP
Zeng, SH
Li, GQ
Cheng, YC
1998
122
Suppression of hot-electron-induced interface degradation in metal-oxide-semiconductor devices by backsurface argon bombardment
Proceeding/Conference:
Proceedings of the IEEE Hong Kong Electron Devices Meeting
Huang, MQ
Lai, PT
Xu, JP
Zeng, SH
Li, GQ
Cheng, YC
1997
