Showing results 3 to 7 of 7
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Title | Author(s) | Issue Date | Views | |
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2006 | ||||
Gate leakage properties of MOS devices with tri-layer high-k gate dielectric Journal:Microelectronics Reliability | 2007 | 241 | ||
Gate leakage properties of MOS devices with TriLayer high-k gate dielectric Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC | 2006 | 90 | ||
Metal-phosphorus network on Pt(111) Journal:2D Materials | 2022 | 7 | ||
2023 |