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	Title	Author(s)	Issue Date	Views
	Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers	Chen, TP Tse, MS Sun, CQ Fung, S	2002	51
	Profile of optical constants of SiO 2 thin films containing Si nanocrystals Journal:Journal of Applied Physics	Chen, TP Liu, Y Tse, MS Fung, S Dong, G	2004	238
	Random capacitance modulation due to charging/discharging in Si nanocrystals embedded in gate dielectric Journal:Nanotechnology	Liu, Y Chen, TP Ng, CY Tse, MS Zhao, P Fu, YQ Zhang, S Fung, S	2005	72
	Reactivity of Ru(OAc)2(Ph3P)2 toward chelating diphosphine ligands. X-ray crystal structures of fac-Ru(OAc)2(Ph3P) (dppm) and trans-Ru(OAc)2(P2N2H4) Journal:Polyhedron	Wong, WK Lai, KK Tse, MS Tse, MC Gao, JX Wong, WT Chan, S	1994	96
	Snapback behaviour and its similarity to the switching behaviour in ultra-thin silicon dioxide films after hard breakdown Journal:Journal of Physics D: Applied Physics	Chen, TP Tse, MS Sun, CQ Fung, S Lo, KF	2001	72
	Static dielectric constant of isolated silicon nanocrystals embedded in a SiO 2 thin film Journal:Applied Physics Letters	Ng, CY Chen, TP Ding, L Liu, Y Tse, MS Fung, S Dong, ZL	2006	95

Showing results 11 to 16 of 16 < previous