Showing results 5 to 6 of 6
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| Title | Author(s) | Issue Date | Views | |
|---|---|---|---|---|
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2002 | 55 | ||
Snapback behaviour and its similarity to the switching behaviour in ultra-thin silicon dioxide films after hard breakdown Journal:Journal of Physics D: Applied Physics | 2001 | 163 |