Browsing by Author Lo, HB

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 中
Showing results 8 to 16 of 16 < previous 
TitleAuthor(s)Issue DateViews
 
Kinetics of thermal oxidation of 6H silicon carbide in oxygen plus trichloroethylene
Journal:Journal of the Electrochemical Society
Yang, BLLin, LMLo, HBLai, PTChan, CL
2005
186
 
Modeling of current gain's temperature dependence in heterostructure-emitter bipolar transistors
Journal:IEEE Transactions on Electron Devices
Yang, ESHsu, CCLo, HBYang, YF
2000
163
 
Off-state gate current with quasi-zero temperature coefficient in n-MOSFETs with reoxidized nitrided oxide as gate dielectric
Journal:Microelectronics Reliability
Lai, PTXu, JPLo, HBCheng, YC
1998
107
 
Quality improvement of low-pressure chemical-vapor-deposited oxide by N2O nitridation
Journal:Applied Physics Letters
Lai, PTXu, JLo, HBCheng, YC
1997
192
 
A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge
Journal:Microelectronics Reliability
Van, BPYang, YFHsu, CCLo, HBYang, ES
2001
143
 
A study on interface and charge trapping properties of nitrided n-channel metal-oxide-semiconductor field-effect transistors by backsurface argon bombardment
Journal:Journal of Applied Physics
Lai, PTXu, JPLo, HBGheng, YC
1997
164
 
Suppression of hot-carrier-induced degradation in n-MOSFETS at low temperatures by N 2O-nitridation of gate oxide
Journal:Solid-State Electronics
Lai, PTXu, JPHuang, LLo, HBCheng, YC
1998
103
 
Temperature dependence of current gain of GalnP/GaAs heteroj unction and heterostructure-emitter bipolar transistors
Journal:IEEE Transactions on Electron Devices
Yang, ESYang, YFHsu, CCOu, HJLo, HB
1999
153
 
Thermal effect on current gains of an AlGaAs/GaAs heterostructure-emitter bipolar transistor
Journal:Applied Physics Letters
Lo, HBYang, ESYang, YF
1999
155
Showing results 8 to 16 of 16 < previous