Browsing by Author Li, CX

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TitleAuthor(s)Issue DateViews
 
2014
80
 
A compact threshold-voltage model of MOSFETs with stack high-k gate dielectric
Proceeding/Conference:2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
2009
209
 
2010
88
 
2016
46
 
2007
81
Effects of annealing gas on electrical properties and reliability of Ge MOS capacitors with HfTiON as gate dielectric
Proceeding/Conference:IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007
2007
61
 
Effects of annealing gas species on the electrical properties and reliability of Ge MOS capacitors with high-k Y 2O 3 gate dielectric
Proceeding/Conference:2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
2009
86
 
2010
80
 
Effects of sputtering and annealing temperatures on MOS capacitor with HfTiON gate dielectric
Proceeding/Conference:Proceedings of the IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2009
2009
86
 
2008
75
 
2010
73
Electrical properties of HfTiO gate-dielectric metal oxide semiconductor capacitors with NO and N 2O surface nitridations
Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010
2010
54
 
2007
77
 
Enhanced performance of Si MOS capacitors with HfTaOxNy gate dielectric by using AlOxNy or TaOxNy interlayer
Proceeding/Conference:IEEE Conference on Electron Devices and Solid-State Circuits Proceedings
2008
59
 
2004
 
2020
1
 
2012
103
 
2012
114
Gate-leakage model of Ge MOS capacitor with high-k gate dielectric
Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
2007
87
 
2018
29