Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
1993
149
 
2000
109
 
1995
144
 
Effects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
1997
38
 
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
37
 
2000
178
Effects of nitridation and re-oxidation on drain leakage current in n-channel MOSFETs
Proceeding/Conference:Conference on Solid State Devices and Materials
1990
112
 
1993
161
 
1992
160
 
Electrical properties of different NO-annealed oxynitrides
Proceeding/Conference:Journal of Non-Crystalline Solids
1999
169
 
Electron trapping and detrapping behaviors of thin thermally nitrided oxides
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
1989
36
 
2000
147
 
Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
25
 
2006
65
 
2005
95
 
Gate dielectrics prepared by double nitridation in NO and N2O
Journal:Applied Physics A: Materials Science and Processing
2000
138
 
2007
160
 
1999
150
 
1998
117
 
Histochemical Analysis of Medicinal Plants by Using Matrix-Assisted Laser Desorption / Ionization Mass Spectrometry
Proceeding/Conference:Meeting of Consortium for Globalization of Chinese Medicine, CGCM 2007
2007
100