Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
2009
75
 
Characterisation and simulation of substrate current in thermally reoxidised-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Semiconductor Device Research Symposium, ISDRS-91
1991
42
 
1990
150
 
1990
109
 
2000
217
 
2002
196
 
1994
158
 
1985
119
 
A comparison between NO-annealed O2- and N2O-grown gate dielectrics
Proceeding/Conference:IEEE Hong Kong Electron Devices Meeting Proceedings
1998
122
 
1998
104
 
Computer simulation of rapid thermal annealing of thermally grown oxide in ammonia ambient
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
1989
34
 
1998
384
 
1993
149
 
2000
109
 
1995
144
 
Effects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
1997
38
 
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
37
 
2000
178
Effects of nitridation and re-oxidation on drain leakage current in n-channel MOSFETs
Proceeding/Conference:Conference on Solid State Devices and Materials
1990
112
 
1993
161