Browsing by Author Cheng, YC

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 54 to 73 of 107 < previous   next >
TitleAuthor(s)Issue DateViews
 
Instability in GIDL current of thermally-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
1991
30
 
1997
100
 
2007
57
Interface properties of N2O-annealed NH3-treated 6H-SiC MOS capacitor
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1999
65
 
2001
Interface properties of N2O-annealed SiO2/SiC system
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
2000
57
 
Interface properties of NO-annealed N2O-grown oxynitride
Journal:IEEE Transactions on Electron Devices
1999
61
 
1985
44
 
Mathematical Modeling for Evaluating Gustatory Stimulation of Parotid Gland by Proton Density MRI
Proceeding/Conference:The International Society for Magnetic Resonance in Medicine (ISMRM) Annual Meeting & Exhibition
2017
12
Mechanism analysis of gate-induced drain leakage in off-state n-MOSFET
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1997
79
 
1998
63
 
Mechanisms of gate-induced drain leakage in n-MOSFET's
Journal:Microelectronics Reliability
1998
50
 
2011
107
 
1993
55
New observation and improvement in GIDL current of N-MOSFET's with various kinds of gate oxides under hot-carrier stress
Proceeding/Conference:IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE
1997
61
 
1996
 
2005
44
 
1998
57
 
2005
63
 
NOVEL NUMERICAL MODEL FOR SOI DEVICES.
Journal:Electron device letters
1985
40