Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
1992
120
 
2000
203
 
2007
66
 
1992
154
 
2000
167
 
2000
187
 
Improvement of channel-current-induced gate-oxide breakdown in n-MOSFET's using rapid thermal nitridation
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
39
 
1992
99
 
1999
162
 
2007
246
 
2007
112
 
2008
164
 
Instability in GIDL current of thermally-nitrided-oxide n-MOSFET's
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
1991
39
 
1997
119
 
2007
122
Interface properties of N2O-annealed NH3-treated 6H-SiC MOS capacitor
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
1999
122
 
2001
158
Interface properties of N2O-annealed SiO2/SiC system
Proceeding/Conference:Proceedings of the IEEE Hong Kong Electron Devices Meeting
2000
116
 
Interface properties of NO-annealed N2O-grown oxynitride
Journal:IEEE Transactions on Electron Devices
1999
144
 
1985
106