Browsing by Author Cheng, YC

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TitleAuthor(s)Issue DateViews
 
Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
16
 
2006
61
 
2005
69
 
Gate dielectrics prepared by double nitridation in NO and N2O
Journal:Applied Physics A: Materials Science and Processing
2000
153
 
2007
141
 
1999
145
 
1998
104
 
Histochemical Analysis of Medicinal Plants by Using Matrix-Assisted Laser Desorption / Ionization Mass Spectrometry
Proceeding/Conference:Meeting of Consortium for Globalization of Chinese Medicine, CGCM 2007
2007
90
 
1992
105
 
2000
178
 
2007
45
 
1992
149
 
2000
167
 
An, FPBai, WDBalantekin, ABBishai, MBlyth, SCao, GFCao, JChang, JFChang, YChen, HSChen, HYChen, SMChen, YChen, YXCheng, JCheng, JCheng, YCCheng, ZKCherwinka, JJChu, MCCummings, JPDalager, ODeng, FSDing, YYDiwan, MVDohnal, TDolzhikov, DDove, JDugas, KVDuyang, HYDwyer, DAGallo, JPGonchar, MGong, GHGong, HGu, WQGuo, JYGuo, LGuo, XHGuo, YHGuo, ZHackenburg, RWHan, YHans, SHe, MHeeger, KMHeng, YKHor, YKHsiung, YBHu, BZHu, JRHu, THu, ZJHuang, HXHuang, JHHuang, XTHuang, YBHuber, PJaffe, DEJen, KLJi, XLJi, XPJohnson, RAJones, DKang, LKettell, SHKohn, SKramer, MLangford, TJLee, JLee, JHCLei, RTLeitner, RLeung, JKCLi, FLi, HLLi, JJLi, QJLi, RHLi, SLi, SCLi, WDLi, XNLi, XQLi, YFLi, ZBLiang, HLin, CJLin, GLLin, SLing, JJLink, JMLittenberg, LLittlejohn, BRLiu, JCLiu, JLLiu, JXLu, CLu, HQLuk, KBMa, BZMa, XBMa, XYMa, YQMandujano, RCMarshall, CMcDonald, KTMcKeown, RDMeng, YNapolitano, JNaumov, DNaumova, ENguyen, TMTOchoa-Ricoux, JPOlshevskiy, APark, JPatton, SPeng, JCPun, CSJQi, FZQi, MQian, XRaper, NRen, JReveco, CMRosero, RRoskovec, BRuan, XCRussell, BSteiner, HSun, JLTmej, TTreskov, KTse, WHTull, CETung, YCViren, BVorobel, VWang, CHWang, JWang, MWang, NYWang, RGWang, WWang, XWang, YWang, YFWang, ZWang, ZWang, ZMWei, HYWei, LHWen, LJWhisnant, KWhite, CGWong, HLHWorcester, EWu, DRWu, QWu, WJXia, DMXie, ZQXing, ZZXu, HKXu, JLXu, TXue, TYang, CGYang, LYang, YZYao, HFYe, MYeh, MYoung, BLYu, HZYu, ZYYue, BBZavadskyi, VZeng, SZeng, YZhan, LZhang, CZhang, FYZhang, HHZhang, JLZhang, JWZhang, QMZhang, SQZhang, XTZhang, YMZhang, YXZhang, YYZhang, ZJZhang, ZPZhang, ZYZhao, JZhao, RZZhou, LZhuang, HLZou, JH
22-May-2023
 
2000
186
 
Improvement of channel-current-induced gate-oxide breakdown in n-MOSFET's using rapid thermal nitridation
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
34
 
1992
96
 
1999
180
 
2007
202
 
2007
94