Browsing by Author Cheng, YC

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Showing results 21 to 40 of 108 < previous   next >
TitleAuthor(s)Issue DateViews
 
1998
385
 
1993
150
 
2000
110
 
1995
145
 
Effects of Gate-Pulse Shape on the Accuracy of Charge-Pumping Measurement
Proceeding/Conference:International Conference on VLSI and CAD Proceedings
1997
39
 
Effects of hole trapping on degradation behaviors in thermally-nitrided oxides under F-N injection
Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology
1992
38
 
2000
180
Effects of nitridation and re-oxidation on drain leakage current in n-channel MOSFETs
Proceeding/Conference:Conference on Solid State Devices and Materials
1990
113
 
1993
162
 
1992
161
 
Electrical properties of different NO-annealed oxynitrides
Proceeding/Conference:Journal of Non-Crystalline Solids
1999
170
 
Electron trapping and detrapping behaviors of thin thermally nitrided oxides
Proceeding/Conference:Techical Digest of 1989 International Conference on VLSI and CAD (ICVC '89)
1989
37
 
2000
148
 
Enhancement of 1/f noise degradation in n-MOSFETs under AC hot-carrier stress
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
26
 
2006
66
 
2005
96
 
Gate dielectrics prepared by double nitridation in NO and N2O
Journal:Applied Physics A: Materials Science and Processing
2000
139
 
2007
161
 
1999
151
 
1998
118