Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2007
70
 
1993
48
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
52
 
1998
77
 
Power-law dependence of charge trapping on injected charge in very thin SiO 2 films
Journal:Japanese Journal of Applied Physics, Part 2: Letters
2002
50
 
2004
112
 
2012
140
 
2004
77
 
2009
203
 
2005
79
 
1999
51
 
2012
45
 
2009
60
 
1997
57
 
Reverse I-V characteristics of Au/semi-insulating InP (100)
Journal:Semiconductor Science and Technology
1993
47
 
2011
86
 
2006
63
 
2001
76
 
2006
89
 
2009
79