Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2007
68
 
1993
34
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
49
 
1998
90
 
Power-law dependence of charge trapping on injected charge in very thin SiO 2 films
Journal:Japanese Journal of Applied Physics, Part 2: Letters
2002
46
 
2004
233
 
2012
161
 
2004
75
 
2009
319
 
2005
69
 
1999
177
 
2012
46
 
2009
61
 
1997
56
 
Reverse I-V characteristics of Au/semi-insulating InP (100)
Journal:Semiconductor Science and Technology
1993
41
 
2011
78
 
2006
69
 
2001
64
 
2006
91
 
2009
81