Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2007
75
 
1993
40
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
51
 
1998
95
 
Power-law dependence of charge trapping on injected charge in very thin SiO 2 films
Journal:Japanese Journal of Applied Physics, Part 2: Letters
2002
52
 
2004
238
 
2012
167
 
2004
83
 
2009
328
 
2005
73
 
1999
180
 
2012
47
 
2009
64
 
1997
59
 
Reverse I-V characteristics of Au/semi-insulating InP (100)
Journal:Semiconductor Science and Technology
1993
43
 
2011
82
 
2006
73
 
2001
73
 
2006
95
 
2009
86