Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2007
60
 
1993
37
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
46
 
1998
66
 
Power-law dependence of charge trapping on injected charge in very thin SiO 2 films
Journal:Japanese Journal of Applied Physics, Part 2: Letters
2002
45
 
2004
100
 
2012
129
 
2004
67
 
2009
193
 
2005
65
 
1999
43
 
2012
41
 
2009
48
 
1997
52
 
Reverse I-V characteristics of Au/semi-insulating InP (100)
Journal:Semiconductor Science and Technology
1993
39
 
2011
77
 
2006
54
 
2001
62
 
2006
75
 
2009
69