Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2007
66
 
1993
32
 
Post-breakdown conduction instability of ultrathin SiO 2 films observed in ramped-current and ramped-voltage current-voltage measurements
Journal:Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
2002
48
 
1998
88
 
Power-law dependence of charge trapping on injected charge in very thin SiO 2 films
Journal:Japanese Journal of Applied Physics, Part 2: Letters
2002
44
 
2004
224
 
2012
156
 
2004
74
 
2009
318
 
2005
65
 
1999
176
 
2012
46
 
2009
60
 
1997
55
 
Reverse I-V characteristics of Au/semi-insulating InP (100)
Journal:Semiconductor Science and Technology
1993
39
 
2011
74
 
2006
67
 
2001
62
 
2006
87
 
2009
79