Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2002
75
 
1993
50
 
2009
61
 
1995
70
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
40
 
1994
55
 
2010
51
 
2007
48
 
2008
40
 
2006
60
 
2004
57
 
2006
51
 
2009
190
 
2009
63
 
2011
56
 
2012
127
 
2004
72
 
1993
46
 
2006
53
 
2003
53