Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2002
84
 
1993
57
 
2009
72
 
1995
78
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
47
 
1994
64
 
2010
59
 
2007
66
 
2008
59
 
2006
74
 
2004
69
 
2006
64
 
2009
212
 
2009
78
 
2011
64
 
2012
132
 
2004
90
 
1993
56
 
2006
66
 
2003
66