Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
73
 
2005
63
 
2002
96
 
1993
50
 
2009
73
 
1995
85
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
42
 
1994
77
 
2010
61
 
2007
55
 
2008
37
 
2006
68
 
2004
68
 
2006
56
 
2009
186
 
2009
67
 
2011
69
 
2012
154
 
2004
80
 
1993
49