Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
71
 
2005
61
 
2002
95
 
1993
50
 
2009
70
 
1995
85
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
40
 
1994
76
 
2010
59
 
2007
55
 
2008
37
 
2006
65
 
2004
67
 
2006
55
 
2009
185
 
2009
66
 
2011
68
 
2012
152
 
2004
75
 
1993
48