Browsing by Author Chen, TP

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TitleAuthor(s)Issue DateViews
 
2008
74
 
2005
64
 
2002
97
 
1993
53
 
2009
73
 
1995
86
 
Characterization of optical and structural properties of Pt-Si interface by spectroscopic ellipsometry
Proceeding/Conference:Proceedings of the 22nd International Conference on the Physics of Semiconductors, Canada
1994
42
 
1994
78
 
2010
62
 
2007
57
 
2008
39
 
2006
70
 
2004
69
 
2006
57
 
2009
189
 
2009
68
 
2011
70
 
2012
154
 
2004
84
 
1993
50