Browsing by Author rp00197

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TitleAuthor(s)Issue DateViews
 
1/f noise behaviors of NO-nitrided n-MOSFETs
Journal:Solid-State Electronics
2001
106
 
1999
998
A 2-D threshold-voltage model for small MOSFET with quantum-mechanical effects
Proceeding/Conference:2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
2006
78
 
2008
74
 
1998
57
 
2004
76
 
An analysis on stress-induced degradation of 1/f noise in n-MOSFETs
Proceeding/Conference:Proceedings of 15th International Conference Noise in Physical Systems and 1/f Fluctuations
1999
20
 
2010
50
 
A compact threshold-voltage model of MOSFETs with stack high-k gate dielectric
Proceeding/Conference:2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
2009
205
 
2010
105
 
A comparison between NO-annealed O2- and N2O-grown gate dielectrics
Proceeding/Conference:IEEE Hong Kong Electron Devices Meeting Proceedings
1998
90
 
Comparison between TaON/SiO2 and HfON/SiO2 as dual tunnel layer in charge-trapping flash memory applications
Proceeding/Conference:I E E E Conference on Electron Devices and Solid-State Circuits Proceedings
2012
32
 
1998
42
2004
63
 
2000
80
 
2007
58
 
Effect of SiO2/SiC interface on inversion channel electron mobility of 4H-SiC n-MOSFET
Journal:Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
2004
50
 
Effects of annealing gas species on the electrical properties and reliability of Ge MOS capacitors with high-k Y 2O 3 gate dielectric
Proceeding/Conference:2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
2009
115
 
1998
41
 
2010
42